The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Jun. 24, 2004
Applicants:

Yonghong Song, South San Francisco, CA (US);

Xiangyun Kong, Union City, CA (US);

Inventors:

Yonghong Song, South San Francisco, CA (US);

Xiangyun Kong, Union City, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

We present a technique to perform dependence analysis on more complex array subscripts than the linear form of the enclosing loop indices. For such complex array subscripts, we decouple the original iteration space and the dependence test iteration space and link them through index-association functions. The dependence analysis is performed in the dependence test iteration space to determine whether the dependence exists in the original iteration space. The dependence distance in the original iteration space is determined by the distance in the dependence test iteration space and the property of index-association functions. For certain non-linear expressions, we show how to transform it to a set of linear expressions equivalently. The latter can be used in dependence test with traditional techniques. We also show how our advanced dependence analysis technique can help parallelize some otherwise hard-to-parallelize loops.


Find Patent Forward Citations

Song, Yonghong. (2009). Dependency analysis system and method (U.S. Patent No. 7581215). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7581215

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…