The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Jan. 13, 2004
Applicants:

John Randall West, Sunnyvale, CA (US);

Satheesh Kumar Madathiparambil Gopinathan Nair, Santa Clara, CA (US);

Andrew Hyun-chul Kim, Redwood City, CA (US);

Inventors:

John Randall West, Sunnyvale, CA (US);

Satheesh Kumar Madathiparambil Gopinathan Nair, Santa Clara, CA (US);

Andrew Hyun-Chul Kim, Redwood City, CA (US);

Assignee:

Symphony Services Corp., Palo Alto, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A general technique using semantic analysis is provided that can be used for converting a specific automation test script (and its underlying test case), generated from generally available or proprietary test automation tools, into an abstract test case representation. The abstract test case representation is based on a test case representation model that includes application states (state information), external interaction sequences (control flow information) and input data. The abstract representation in essence provides a platform independent representation of test cases. An application object model provides the representational capabilities required for capturing structural and behavioral properties of the application under test. The abstract test case representation can be validated against and further enriched by specific object information from an application metadata repository. Finally, object information and input data can be separated from control flow information to provide automatic parameterization of the test script.


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