The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Sep. 11, 2007
Applicants:

Nozomu Aoyama, Yokohama, JP;

Toshimichi Arima, Fujisawa, JP;

Takaharu Itoh, Yokohama, JP;

Yuko Ito, Yokohama, JP;

Inventors:

Nozomu Aoyama, Yokohama, JP;

Toshimichi Arima, Fujisawa, JP;

Takaharu Itoh, Yokohama, JP;

Yuko Ito, Yokohama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An efficient testing method is provided for internationalized software executed in a plurality of language environments. The method includes mock-translating an externalized resource file written in a first language of the internationalized software by converting characters of the first language to characters of a second language based on a conversion table; and displaying output information from the internationalized software that performs processing by referring to the mock-translated test resource file using one of a plurality of fonts prepared for respective test categories.


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