The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Oct. 26, 2006
Shou-kuo Hsu, Taipei Hsien, TW;
Cheng-shien LI, Taipei Hsien, TW;
Shou-Kuo Hsu, Taipei Hsien, TW;
Cheng-Shien Li, Taipei Hsien, TW;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A method for analyzing length differences in differential signal paths includes: loading a design file of the differential signal paths from a storage device (); simulating the differential signal paths based on the design file; dividing simulated differential signal paths into a plurality of segments by impedance division positions that show impedance discontinuity; predefining an acceptable length difference limit for each divided segment, and calculating an real length difference for each divided segment; comparing the real length difference with the acceptable length difference limit correspondingly to generate a plurality of analyzed results corresponding to the plurality of divided segments; selecting one or more compared segments to check analyzed results of selected segments; and locating the selected segments in the simulated differential signal paths, and generating analyzed information comprising analyzed results of the selected segments. A related system is also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile