The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Nov. 01, 2005
Applicants:

Piali DE, Harvard, MA (US);

John A. Cogliandro, Dedham, MA (US);

John E. Rannenberg, N. Kingstown, RI (US);

Joe R. Wang, Boston, MA (US);

Amir W. Habboosh, Somerset, MA (US);

Inventors:

Piali De, Harvard, MA (US);

John A. Cogliandro, Dedham, MA (US);

John E. Rannenberg, N. Kingstown, RI (US);

Joe R. Wang, Boston, MA (US);

Amir W. Habboosh, Somerset, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for mission profiling includes generating a human model including human activities and generating a system model including system functions. The method also includes generating an operational node model, including operational activities; and integrating the human model, the system model and the operational model to form an integrated mission model.


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