The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Jun. 12, 2007
Matthew Craig Bullock, Irving, TX (US);
Alessandro Paglieri, Richardson, TX (US);
Jayashree Saxena, Richardson, TX (US);
Matthew Craig Bullock, Irving, TX (US);
Alessandro Paglieri, Richardson, TX (US);
Jayashree Saxena, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Disclosed herein is a massive multi-site (MMS) testing architecture. The MMS architecture includes a MMS interface on each of a plurality of devices under test. The MMS interface includes a test protocol manager that may receive test stimulus and send the test stimulus to cores of the device under test. The test protocol manager may receive test responses from cores of the device under test and generate test comparisons based on comparisons between the test responses and expected responses. The test protocol manager may store the test comparisons on the device under test and communicate the stored test comparisons to automated test equipment (ATE) upon being queried by the ATE. The device under test may send the test comparisons to the ATE over a low-bandwidth communication.