The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Sep. 24, 2007
Josef Muenz, Munich, DE;
Josef Muenz, Munich, DE;
Texas Instruments Deutschland GmbH, Freising, DE;
Abstract
A method of adjusting process variables in a processing flow is disclosed. Processed samples are tested to determine sample parameters of the tested samples. The sample parameters are analyzed analyzing in relation to the process variables applied in the processing steps to determine the impact of the process variables on the sample parameters The process variables are modified in an attempt to change the sample parameters towards predetermined target values. And, the sequence of processing steps is repeated with the modified process variables. The analyzing step includes, for given samples, automated matching between patterns of process variables applied for the samples and corresponding sample data sets of parameters determined from the samples; quantifying the degree of match in terms of score values associated with patterns of process variables; and determining the significance of said score values in terms of significance values based on the deviation of the parameters in the sample data sets from said predetermined target values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile