The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Nov. 14, 2003
Applicants:

Atsuhiro Sakurai, Ibaraki, JP;

Yoshihide Iwata, Ibaraki, JP;

Inventors:

Atsuhiro Sakurai, Ibaraki, JP;

Yoshihide Iwata, Ibaraki, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A time-domain time-scale modification method based on the synchronous overlap-and-add method consists of a generalization of the envelope-matching time-scale modification method. The cross-correlation function employs a fixed-size cross-correlation buffer to eliminate the need for normalization inside the search loop. This fixed-size cross-correlation buffer is the center of the overlap region corresponding to the case where the fine overlap adjustment value is set to zero. The computational cost of this invention is lower than any other method with a comparable quality.


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