The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Apr. 18, 2006
Eric H. Smith, San Jose, CA (US);
Richard L. Kendrick, San Mateo, CA (US);
Eric H. Smith, San Jose, CA (US);
Richard L. Kendrick, San Mateo, CA (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A method of restoring low spatial frequency spectral information to an image using a Fizeau Fourier transform spectrometer ('FFTS') system is provided. Portions of a wavefront collected by the FFTS are interfered. The interference patterns are Fourier transformed to generate spectral images. A region of the image is identified, for which spectral information is predetermined. Object estimates are generated, each of which corresponds to a spectral image. Each object estimate is iteratively adjusted applying a system spectral optical transfer function ('SOTF') to it and modifying it until a match is made with the corresponding spectral image. Each adjusted object estimate is then iteratively restored by applying a system optical transfer function (“OTF”) to it and then applying a DC bias to it until a match is made between the identified region in the sum of the object estimates and the identified region of a measured panchromatic object image.