The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Aug. 29, 2008
Vyacheslav L. Zavadsky, Ottawa, CA;
Val Gont, Kanata, CA;
Edward Keyes, Ottawa, CA;
Jason Abt, Kanata, CA;
Stephen Begg, Ottawa, CA;
Vyacheslav L. Zavadsky, Ottawa, CA;
Val Gont, Kanata, CA;
Edward Keyes, Ottawa, CA;
Jason Abt, Kanata, CA;
Stephen Begg, Ottawa, CA;
Semiconductor Insights Inc., , CA;
Abstract
The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.