The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7580340 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 25, 2009

Filed:

Nov. 28, 2005
Applicants:

Hiroshi Shingai, Tokyo, JP;

Jiro Yoshinari, Tokyo, JP;

Hideaki Miura, Tokyo, JP;

Inventors:

Hiroshi Shingai, Tokyo, JP;

Jiro Yoshinari, Tokyo, JP;

Hideaki Miura, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical recording medium and a method for testing that optical recording medium are provided, which can prevent degradation of a reproduction signal in the case where the optical recording medium is stored at a high temperature for a long time, which enables stable recording and reproduction of data before and after the high-temperature storage, and which can achieve high-speed recording and increase of recording density. In the optical recording medium, a reproduction signal output of a recording mark after high-temperature storage that is formed in a recording layer after the optical recording medium is stored at a storage temperature t in a range from 60° C. to 90° C. for at least 50−(4/3)(t−60) hours is 0.9 times or more a reproduction signal output of a recording mark before the high-temperature storage that has the same bit length as the recording mark after the high-temperature storage and is formed before the above high-temperature storage.


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