The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Oct. 26, 2005
Applicants:

Xiao Lin, San Jose, CA (US);

Louis J. Serrano, Los Gatos, CA (US);

Inventors:

Xiao Lin, San Jose, CA (US);

Louis J. Serrano, Los Gatos, CA (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus comprising a center error creation circuit, a center error controller, and a center error repeatable run out circuit. The center error creation circuit may be configured to generate a center error signal in response to photo-diode signals. The center error controller may be configured to adjust a lens to a center position in a sled housing with a step motor in response to a center error measure signal. The center error repeatable run out circuit may be configured to generate a center error run out signal and the center error measure signal in response to the center error signal. The center error repeatable run out circuit may generate the center error measure signal by measuring the center error signal when the center error run out signal is in a peak phase.


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