The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Jul. 13, 2006
Applicant:

Pil-sang Yoon, Suwon-si, KR;

Inventor:

Pil-Sang Yoon, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/07 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an optical information detecting method comprising: detecting an image of a source data page containing a frame mask by the use of an optical detection region within respective 1:N (where N is greater than 1) excessive detection pixels; monitoring a light intensity of the detected image and determining a matching state of the frame mask; determining an arrangement pattern of valid detection pixels of the detection pixels in accordance with the determined matching state of the frame mask and detecting sampling detection pixels; and sampling an image of the sampling detection pixels from the detected image and reproducing the image of the source data page. There is also an optical information detector used to put the optical information detecting method into practice. Accordingly, it is possible to detect optical information with high reliability without performing complex calculation by the use of a 1:N over-sampling method.


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