The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Sep. 12, 2006
Kuo-cheng Huang, Hsinchu, TW;
Wen-hong Wu, Hsinchu, TW;
Chia-wei Hsu, Hsinchu, TW;
Ting-ming Huang, Hsinchu, TW;
Kuo-Cheng Huang, Hsinchu, TW;
Wen-Hong Wu, Hsinchu, TW;
Chia-Wei Hsu, Hsinchu, TW;
Ting-Ming Huang, Hsinchu, TW;
Instrument Technology Research Center, Hsinchu, TW;
Abstract
A lens inspection device and method are provided. The lens inspection method includes the steps of providing a collimating light beam, polarizing the collimating light beam by a polarizer to produce a polarized light beam, deflecting the polarized light beam by a lens to be measured to produce a deflected light beam, providing a phase retardation plate through which a polarized compensation image is generated, and comparing the polarized compensation image with a lookup table having standard color values of a plurality of standard polarization compensated images recorded therein, so as to determine whether a deformation is presented on the lens.