The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Oct. 24, 2006
Applicants:

Hideo Igami, Fujisawa, JP;

Yuhta Ishii, Machida, JP;

Robert Tucker Sanders, Raleigh, NC (US);

Inventors:

Hideo Igami, Fujisawa, JP;

Yuhta Ishii, Machida, JP;

Robert Tucker Sanders, Raleigh, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Bi-axial tilt monitoring apparatus and method for bi-axial tilt monitoring of an article using a single-axis tilt monitoring device. A bi-axial tilt monitoring apparatus according to exemplary embodiments includes a single-axis tilt monitoring device and a support member supporting the single-axis tilt monitoring device and mountable to an article to be monitored. The support member has a supporting surface for supporting the single-axis tilt monitoring device at an acute angle relative to a substantially vertical surface of the article to be monitored when the tilt monitoring apparatus is mounted to the article to be monitored.


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