The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2009

Filed:

Oct. 12, 2007
Applicants:

Kiyoshi Kasai, Niigata, JP;

Takehiro Ishikawa, Nagano, JP;

Tetsuji Ozawa, Niigata, JP;

Koji Kamata, Niigata, JP;

Ritsu Suzuki, Nagano, JP;

Hideki Takeuchi, Nagano, JP;

Inventors:

Kiyoshi Kasai, Niigata, JP;

Takehiro Ishikawa, Nagano, JP;

Tetsuji Ozawa, Niigata, JP;

Koji Kamata, Niigata, JP;

Ritsu Suzuki, Nagano, JP;

Hideki Takeuchi, Nagano, JP;

Assignee:

Kissei Pharmaceutical Co., Ltd., Matsumoto-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07C 217/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Crystals of a salt of 4'-{2-[(1S,2R)-2-hydroxy-2-(4-hydroxyphenyl)-1-methylethylamino]ethoxy}-3-isopropyl-3′,5′-dimethylbiphenyl-4-carboxylic acid. The α type, β type and γ type crystals produced by treating hydrochloride of 4′-{2-[(1S,2R)-2-hydroxy-2-(4-hydroxyphenyl)-1-methylethylamino]ethoxy}-3-isopropyl-3′,5′-dimethylbiphenyl-4-carboxylic acid with specified solvents, which can be discriminated by the characteristic diffraction peaks of powder X-ray diffractometry and the like.


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