The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2009
Filed:
Jul. 01, 2005
Applicants:
Tatsuya Hattori, Saitama-ken, JP;
Pu Qian, Saitama-ken, JP;
Inventors:
Tatsuya Hattori, Saitama-ken, JP;
Pu Qian, Saitama-ken, JP;
Assignee:
Honda Motor Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 13/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning probe microscope system comprising a hollow probea tubeconnected to a rear endof the hollow probea support tableprovided under the hollow probeand a substrateand a meansfor washing the hollow probethat are fixed to the support tablea sample S passing through the tubeand the hollow probeand the substrateand the washing meansbeing moved by the support tablesuch that each of them opposes the hollow probe
Quick Actions:
Hattori, Tatsuya. (2009). Scanning probe microscope system (U.S. Patent No. 7578853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7578853
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile