The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Sep. 14, 2005
Bruce L. Nelson, Woodinville, WA (US);
Brian T. Klamik, Redmond, WA (US);
Bruce L. Nelson, Woodinville, WA (US);
Brian T. Klamik, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Sampled profile data provides information about processor activity during a test. Processor activity can be analyzed to determine an amount of processor resources used to execute the various functions, modules, and processes associated with a tested software activity. Statistical methods can be applied to the resource data from multiple test runs to determine whether a significant regression has occurred between a baseline test pass and a daily test pass. By collecting data at the function, module and process levels, significant regressions may be uncovered at any of the levels. Regressions may also be ranked according to their importance, which allows for identification and notification of development teams responsible for significant regressions.