The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Jul. 23, 2004
Applicants:

Yuh-cherng Wu, San Jose, CA (US);

Horatiu-zeno Simon, Heidelberg, DE;

Huiling Gong, Sunnyvale, CA (US);

Inventors:

Yuh-Cherng Wu, San Jose, CA (US);

Horatiu-Zeno Simon, Heidelberg, DE;

Huiling Gong, Sunnyvale, CA (US);

Assignee:

SAP AG, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One implementation provides a method for analyzing the validity of a proposed change to an electronic entity. The method includes receiving the proposed changes to an electronic entity from an external device, and calculating a validity index based on a set of definable rules. The inputs to the calculation include quantified values that represent either contextual information about the proposed change or information about a user proposing the change, or some combination thereof. After the calculation of the validity index, the method includes deciding, based on the calculated validity index, whether to proceed further in applying the proposed change to the electronic entity.


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