The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Nov. 30, 2005
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Zhongguo LI, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
Tian Chen, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Zhongguo Li, Shanghai, CN;
Jianming Zheng, Shanghai, CN;
Steven Robert Hayashi, Niskayuna, NY (US);
Xiaoming Du, Shanghai, CN;
General Electric Company, Niskayuna, NY (US);
Abstract
A method for extracting parameters of a cutting tool is provided. The method includes obtaining a measurement data set having a point cloud corresponding to a surface of the cutting tool and virtually slicing the point cloud at a pre-determined section to obtain a set of points on the pre-determined section. The method also includes generating a plurality of curves through the set of points and optimizing the plurality of curves to generate optimized fitting curves and extracting the parameters of the cutting tool from the optimized fitting curves. Furthermore, based on the presented rotary angle projection technique, a plurality of parameters can be extracted for the cutting tool.