The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Aug. 07, 2006
Applicants:

Daisuke Inoue, Ebina, JP;

Hidekazu Takahashi, Zama, JP;

Inventors:

Daisuke Inoue, Ebina, JP;

Hidekazu Takahashi, Zama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 7/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Although an area type focus detecting device for performing phase difference detection type multi point autofocus is used for high speed high precision autofocus of multi points in a wide region, there is a problem of cost increase due to the increase of the chip area. In accordance with the present invention, the photoreceiving area of a specific pixel in an area sensor is made larger than the photoreceiving area of other pixels in the same area sensor. Thus, because the sensor sensitivity is improved and the increase of the chip area is suppressed to a minimum level, a low cost high precision area type focus detecting device can be provided.


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