The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Jan. 29, 2004
Harry Vig, North Billerica, MA (US);
Jonathan Young, Newburyport, MA (US);
Paul A. Jankovich, Northborough, MA (US);
Harry Vig, North Billerica, MA (US);
Jonathan Young, Newburyport, MA (US);
Paul A. Jankovich, Northborough, MA (US);
MagiQ Technologies, Inc., New York, NY (US);
Abstract
A method () of performing photon detector autocalibration in quantum key distribution (QKD) system () is disclosed. The method () includes a first act () of performing a detector gate scan to establish the optimum arrival time of a detector gate pulse (S) that corresponds with a maximum number of photon counts (N) from a single-photon detector () in the QKD system (). Once the optimal detector gate pulse arrival time is determined, then in an act (), the detector gate scan is terminated and in an act () a detector gate dither process is initiated. The detector gate dither act () involves varying the arrival time (T) of the detector gate pulse (S) around the optimal value of the arrival time established during the detector gate scan process. The detector gate dither provides minor adjustments to the arrival time to ensure that the detector () produces maximum number of photon counts (N).