The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Jun. 09, 2003
Sung-dong Kim, Seoul, KR;
Sung-dong Kim, Seoul, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
A magnetic recording medium and an apparatus and a method for reading data using spin-dependent scattering of electrons are provided. The apparatus includes a probe, a magnetic recording medium, a control unit, and a measurement unit. The probe emits hot electrons through a Schottky junction or tunnel barrier. The magnetic recording medium includes a substrate, a first magnetic layer placed over the substrate, a non-magnetic layer placed over the first magnetic layer, and a second magnetic layer placed over the non-magnetic layer and having a magnetization direction parallel or anti-parallel with a magnetization direction of the first magnetic layer. The control unit applies voltage to the probe so that the probe can emit hot electrons. The measurement unit reads data recorded on the magnetic recording medium by detecting output current at the substrate that varies according to the parallel or anti-parallel alignment of magnetizations of the first and second magnetic layers.