The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Mar. 12, 2004
Applicants:

Tetsuya Ogata, Tokyo, JP;

Shigeru Oohchida, Tokyo, JP;

Junichi Kitabayashi, Kanagawa, JP;

Suguru Douwaki, Kanagawa, JP;

Inventors:

Tetsuya Ogata, Tokyo, JP;

Shigeru Oohchida, Tokyo, JP;

Junichi Kitabayashi, Kanagawa, JP;

Suguru Douwaki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/135 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tilt sensor for detecting information related to a tilt of an object to a reference plane is disclosed. The tilt sensor includes a diffraction element disposed that diffracts an incident light at diffraction efficiency depending on the incident angle, and a photo detector that detects a diffraction light diffracted by said diffraction element and outputs an photoelectric signal. Since the diffraction efficiency of the diffraction element changes as the incident angle changes, the intensity of the diffraction light from the diffraction element changes. As a result, the photoelectric signal output from the photo detector contains the information related to the tilt of the object.


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