The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Aug. 26, 2004
Evan F. Cromwell, Redwood City, CA (US);
Johann F. Adam, Palo Alto, CA (US);
Andrei Brunfeld, Cupertino, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Christopher J. Seipert, San Jose, CA (US);
Evan F. Cromwell, Redwood City, CA (US);
Johann F. Adam, Palo Alto, CA (US);
Andrei Brunfeld, Cupertino, CA (US);
Paul B. Comita, Menlo Park, CA (US);
Christopher J. Seipert, San Jose, CA (US);
Blueshift Biotechnologies, Inc., Sunnyvale, CA (US);
Abstract
Methods and apparatus, including computer program products, implementing and using techniques for collecting optical data pertaining to one or more characteristics of a sample. A light beam of a first frequency is scanned onto a sample surface using one or more illumination optical elements. Light of a second frequency is collected from a scan line on the sample surface using one or more collection optical elements. None of the one or more collection optical elements are included among the one or more illumination optical elements. The collected light is transmitted to a detector.