The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Jul. 25, 2008
Roger W. Engelbart, St. Louis, MO (US);
Reed Hannebaum, Mount Vernon, IL (US);
Tim Pollock, Ballwin, MO (US);
Roger W. Engelbart, St. Louis, MO (US);
Reed Hannebaum, Mount Vernon, IL (US);
Tim Pollock, Ballwin, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
A flaw and foreign object debris (FOD) detection system () for use during fabrication of a structure () includes an illumination device (). The illumination device () is configured to be in proximity with a fabrication system () and illuminates a portion () of the structure (). The illumination device () directs light rays () at acute angles relative to the portion (). A detector () monitors the portion () and detects FOD in the portion () during fabrication of the structure () in response to the reflection of the light rays () off of the portion ().