The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Dec. 21, 2004
Marc Dubois, Clifton Park, NY (US);
Thomas E. Drake, Jr., Fort Worth, TX (US);
Pavel Fomitchov, New York, NY (US);
Marc Dubois, Clifton Park, NY (US);
Thomas E. Drake, Jr., Fort Worth, TX (US);
Pavel Fomitchov, New York, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
The present invention provides a compact optical probe assembly that measures ultrasound in materials. The probe uses angle-terminated optical fiber to direct illumination laser light at the surface of a remote target. Ultrasonic displacements at the surface scatter the illumination laser light. Angle-terminated optical fibers collect phase modulated light and direct the phase modulated light to an optical processor to produce a signal representative of the ultrasonic surface displacements. The probe may also incorporate angle-terminated optical fibers to direct generation laser light to the surface of a remote target to generate ultrasonic surface displacements. Optional shared beam forming element(s) may optically act on the illumination laser and collected phase modulated light.