The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Oct. 25, 2004
Applicants:

Kenichi Hayami, Tokyo, JP;

Masaaki Kaneko, Tokyo, JP;

Inventors:

Kenichi Hayami, Tokyo, JP;

Masaaki Kaneko, Tokyo, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01);
U.S. Cl.
CPC ...
Abstract

A deviation amount of a top position of a convex surface of a protruding portion formed on a flat member and a deepest position of a concave surface on the back side of the convex surface, is obtained in XY-coordinates in a plane parallel to an extension plane of the flat member. An annular image obtained by illuminating the concave surface is photographed, and the XY-coordinates of the deepest position of the concave surface are obtained based on the image thus obtained. Regarding the convex surface, the X-coordinate and the Y-coordinate of the top position of the convex surface are respectively obtained by a front camera having an image taking optical axis parallel to the extension plane of the flat member and a side camera having an image taking optical axis parallel to the plane and perpendicular to the image taking optical axis of the front camera, and the deviation amount and deviation direction are obtained based on their respective XY-coordinates obtained.


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