The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

May. 11, 2005
Applicants:

D. Mitchel Hanks, Fort Collins, CO (US);

Lawrence N. Taugher, Loveland, CO (US);

Kevin L. Colburn, Greeley, CO (US);

Inventors:

D. Mitchel Hanks, Fort Collins, CO (US);

Lawrence N. Taugher, Loveland, CO (US);

Kevin L. Colburn, Greeley, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting and optimizing the quality of a mark made by a laser on a recording medium, comprising (a) recording a test mark at a selected level of laser power and a selected speed of movement of the recording medium, (b) measuring at least one dimension of the test mark, (c) comparing the at least one dimension of the test mark to a stored reference value for at least one reference dimension, and (d) determining whether the at least one dimension of the test mark is comparable to the at least one dimension of the stored reference value.


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