The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Jun. 15, 2007
Applicants:

Sterling Whitaker, Albuquerque, NM (US);

Lowell Miles, Albuquerque, NM (US);

Jody Gambles, Post Falls, ID (US);

Gary K. Maki, Coeur D'Alene, ID (US);

Inventors:

Sterling Whitaker, Albuquerque, NM (US);

Lowell Miles, Albuquerque, NM (US);

Jody Gambles, Post Falls, ID (US);

Gary K. Maki, Coeur D'Alene, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnosable structured logic array and associated process is provided. A base cell structure is provided comprising a logic unit comprising a plurality of input nodes, a plurality of selection nodes, and an output node, a plurality of switches coupled to the selection nodes, where the switches comprises a plurality of input lines, a selection line and an output line, a memory cell coupled to the output node, and a test address bus and a program control bus coupled to the plurality of input lines and the selection line of the plurality of switches. A state on each of the plurality of input nodes is verifiably loaded and read from the memory cell. A trusted memory block is provided. The associated process is provided for testing and verifying a plurality of truth table inputs of the logic unit.


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