The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Sep. 03, 2008
Applicants:

Wei-kai Huang, Hsin-Chu, TW;

Chin-lun Lee, Hsin-Chu, TW;

Chia-chiang Lin, Hsin-Chu, TW;

Inventors:

Wei-Kai Huang, Hsin-Chu, TW;

Chin-Lun Lee, Hsin-Chu, TW;

Chia-Chiang Lin, Hsin-Chu, TW;

Assignee:

AU Optronics Corp., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An LCD device having test architecture includes a plurality of data lines, a plurality of gate lines, a plurality of common lines, and a plurality of rows of pixel units. The odd and even common lines are utilized for furnishing a first common voltage and a second common voltage, respectively. The odd and even rows of pixel units are coupled to corresponding odd and even common lines, respectively. Furthermore, disclosed is a test method for detecting defects of the LCD device. The test method includes enabling all the gate lines and furnishing a first test voltage to a corresponding data line during a first interval, disabling even gate lines and furnishing a second test voltage to the corresponding data line during a second interval, and switching the second common voltage from a first common test voltage to a second common test voltage during a third interval.


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