The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
Sep. 20, 2007
Sheng-feng LU, Hsinchu, TW;
Shih-ming Chen, Kaohsiung, TW;
Chien-pang Lin, Taoyuan, TW;
Ming-hsun Sung, Taoyuan, TW;
Sheng-Feng Lu, Hsinchu, TW;
Shih-Ming Chen, Kaohsiung, TW;
Chien-Pang Lin, Taoyuan, TW;
Ming-Hsun Sung, Taoyuan, TW;
VisEra Technologies Company Limited, Hsinchu, TW;
Abstract
A test board for wafer level semiconductor testing is disclosed. The test board comprises a plurality of wires and microelectronic devices; and a plurality of test sockets on an upper surface of the test board. Each test socket comprises: a base member configured for attachment to the test board with a first set of screws, wherein the base member has a central opening exposing a portion of the underlying test board; an anisotropic conductive film disposed within the central opening of the base member; a chip to be tested, disposed on the anisotropic conductive film within the central opening of the base member; and a cover member overlying the chip, attached to the base member with a second set of screws.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile