The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2009
Filed:
May. 15, 2008
Cai Xia Fu, Shenzhen, CN;
Jian Min Wang, Shenzhen, CN;
BI Da Zhang, Shenzhen, CN;
Qiang Zhang, Shenzhen, CN;
Cai Xia Fu, Shenzhen, CN;
Jian Min Wang, Shenzhen, CN;
Bi Da Zhang, Shenzhen, CN;
Qiang Zhang, Shenzhen, CN;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention discloses a method and an apparatus for reconstructing a parallel-acquired image, comprising: generating reconstruction data by combining uniformly under-sampled data and low-frequency fully-sampled data in MRI K-space according to a hybrid sampling mode; calculating the sensitivity distribution of a coil according to said low-frequency fully-sampled data; and reconstructing an image according to the reconstruction data, the coil's sensitivity distribution and the hybrid sampling mode. The signal to noise ratio of the reconstructed image is effectively improved by using the reconstruction data combined with the low-frequency fully-sampled data in reconstructing the image since the low-frequency fully-sampled data contains more useful information.