The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Jun. 07, 2007
Applicant:

Dexter Eames, Cambridge, MA (US);

Inventor:

Dexter Eames, Cambridge, MA (US);

Assignee:

XRF Corporation, Somerville, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a device and method for detecting and analyzing radiation. A detection unit includes a detector, and generates signal pulses from photons of the radiation. Each signal pulse has an amplitude that is determined by an interaction of the photons at a depth of the detector. A pulse deficit correction trigger corrects for charge deficits that occur from the photon interaction across the depth of the detector by removing depth dependence in the amplitudes of the signal pulses. A multi-channel analyzer receives the signal pulses and generates a spectrum from the received signal pulses, and receives a trigger signal that is generated by the pulse deficit correction trigger to remove the depth dependence in the amplitudes of the signal pulses.


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