The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2009

Filed:

Sep. 13, 2005
Applicants:

Richard W. Newman, Auburn, NY (US);

Corinn C. Fahrenkrug, Liverpool, NY (US);

Inventors:

Richard W. Newman, Auburn, NY (US);

Corinn C. Fahrenkrug, Liverpool, NY (US);

Assignee:

Welch Allyn, Inc., Skaneateles Falls, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus that can measure images of at least a portion of an eye and record data sets indicative of a neurological condition. A method interrelates an image and a data set to provide an interpretive result. The apparatus and method thereby provide guidance as to the presence of a medical condition in a patient. The apparatus and method can be used in an iterative measurement process, in which the apparatus attempts to discern normal health from a state of health that is not normal health. If the interpretive result is consistent with normal health, the process terminates, information is recorded, and an optional report is given. If the interpretive result is not consistent with normal health, the apparatus and method attempts to distinguish which condition is consistent with the data and images used, and can iterate with additional measurements and information to attempt to provide a useful interpretive result.


Find Patent Forward Citations

Newman, Richard. (2009). Apparatus and method of diagnosis of optically identifiable ophthalmic conditions (U.S. Patent No. 7575321). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7575321

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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