The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Jul. 12, 2005
Mark Hampton, Revel, FR;
Mark Hampton, Revel, FR;
Springsoft USA, Inc., San Jose, CA (US);
Abstract
Methods and systems for evaluating computer program tests by mutation analysis, including the execution of mutated programs with the insertion of mutations and the identification of mutated programs which, with a pre-determined test, provide a result identical to a pre-determined result. A series of relevant tests is selected for each mutation from a plurality of tests. A mutation ranking system can be determined with the application of at least a first simplicity criterion to the selected series of tests. The mutated programs are subsequently executed according to the mutation ranking order. Each mutated program is executed with the tests from the associated series of tests. In addition, the method can comprise the programming and activation of a programmable circuit. A ranking system for the tests from a series of tests can be determined with the application of a second simplicity criterion to the tests from said series of tests.