The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Apr. 07, 2005
Steven Ross Ferguson, Granite Shoals, TX (US);
Garrett Stephen Koch, Cambridge, VT (US);
Osamu Takahashi, Round Rock, TX (US);
Michael Brian White, Austin, TX (US);
Steven Ross Ferguson, Granite Shoals, TX (US);
Garrett Stephen Koch, Cambridge, VT (US);
Osamu Takahashi, Round Rock, TX (US);
Michael Brian White, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method is provided to utilize built-in self test (BIST) latches for multiple purposes. Conventionally, BIST latches are single purpose. Hence, separate latches are utilized for array built-in self test (ABIST) and logic built-in self test (LBIST) operations. By having the separate latches, though, a substantial amount area is lost. Therefore, to better utilize the latches and the area, ABIST latches are reconfigured to utilize some previously unused ports to allow for multiple uses for the latches, such as for LBIST.