The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
May. 21, 2008
Jimmie Earl Dewitt, Jr., Georgetown, TX (US);
Frank Eliot Levine, Austin, TX (US);
Christopher Michael Richardson, Austin, TX (US);
Robert John Urquhart, Austin, TX (US);
Jimmie Earl DeWitt, Jr., Georgetown, TX (US);
Frank Eliot Levine, Austin, TX (US);
Christopher Michael Richardson, Austin, TX (US);
Robert John Urquhart, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus, and computer instructions in a data processing system for processing instructions are provided. Instructions are received at a processor in the data processing system. If a selected indicator is associated with the instruction, counting of each event associated with the execution of the instruction is enabled. Functionality may be provided in the performance monitoring application for initiating the measurement of secondary metrics with regard to identified instructions, data addresses, ranges of identified instructions, or ranges of identified data addresses, based on counter values for primary metrics. Thus, for example, when a primary metric counter, or a combination of primary metric counters, meets or exceeds a predetermined threshold value, an interrupt may be generated. In response to receiving the interrupt, counters associated with the measuring of secondary metrics of a range of instructions/data addresses may be initiated.