The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Sep. 26, 2003
Applicants:
Paul A. Edney, Evanston, IL (US);
Joseph T. Walsh, Jr., Evanston, IL (US);
Inventors:
Paul A. Edney, Evanston, IL (US);
Joseph T. Walsh, Jr., Evanston, IL (US);
Assignee:
Northwestern University, Evanston, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for processing signals, such as a tomography signal, in the time domain provides both high spatial resolution and high frequency resolution but at low cost. The method uses non-linear regression with a sinusoidal model to fit a sine wave to a portion of the signal that is less than a full cycle of a wave of the signal.
Edney, Paul. (2009). Signal processing using non-linear regression with a sinusoidal model (U.S. Patent No. 7574253). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7574253
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile