The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Oct. 05, 2004
Applicants:
Ian Clarke, Toronto, CA;
Hui Zhou, Toronto, CA;
Jeffrey Matthew Achong, Brampton, CA;
Inventors:
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of fractionally resizing an image comprises locating areas of sensitivity in the image. Adjustment lines in the image are selected at least partially based on the location of the located areas of sensitivity. The image is then resized along the adjustment lines. An apparatus for fractionally resizing an image is also provided.
Clarke, Ian. (2009). Method and apparatus for resizing images (U.S. Patent No. 7574071). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7574071
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile