The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Nov. 01, 2001
Gregory R. Shaw, Calgary, CA;
Mead C. Killion, Elk Grove Village, IL (US);
Gregory R. Shaw, Calgary, CA;
Mead C. Killion, Elk Grove Village, IL (US);
Etymotic Research, Inc., Elk Grove Village, IL (US);
Abstract
A stimulus analysis system and artifact rejection method are disclosed. The method may be used in many applications, such as, for example, DPOAE testing, TEOAE testing, BAER testing, ultrasound, MRI, RADAR, GPS, EEG, EKG, or communications. In one embodiment, a system receives a signal, and depending on the noise power of the signal, the signal is placed in one of a plurality of buffers or is discarded. This process is repeated. The combination of buffers that yields the lowest noise power is then selected. The selected combination of buffers may then be used to calculate a signal to noise ratio, which may be used to determine whether the signal received is acceptable, indicating, for example, that a test has been passed or failed.