The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Feb. 22, 2006
Applicants:
Courtney Flem Morgan, Alpharetta, GA (US);
William Jordan Hall, Atlanta, GA (US);
Inventors:
Courtney Flem Morgan, Alpharetta, GA (US);
William Jordan Hall, Atlanta, GA (US);
Assignee:
Novartis AG, Basel, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to an apparatus and method for non-contact/non-destructive measurement of the geometry of molded ophthalmic lenses and the precision molds and tooling used in the manufacture of the ophthalmic lenses. In particular the present system uses micro computed tomography to measure the geometries.