The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Apr. 12, 2007
Toru Fujiwara, Kato, JP;
Masakazu Taguchi, Kawasaki, JP;
Toru Fujiwara, Kato, JP;
Masakazu Taguchi, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A defect detection device, apparatus, and method for detecting a defect of data recorded on a recording medium. The defect detection device includes a waveform state detection part generating information representing a state of a waveform of a reproduced signal from the recording medium based on soft decision results obtained in a process of reproducing the data in accordance with a maximum likelihood decoding algorithm corresponding to a partial response. The defect detection device includes a defect determination part determining the defect of the recorded data based on the information generated in the waveform state detection part.