The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Nov. 09, 2006
Rainer Uhl, Graefelfing, DE;
Rainer Uhl, Graefelfing, DE;
TILL I.D. GmbH, Graefelfing, DE;
Abstract
There is provided a method for a microscope device for optionally examining a sample by at least a first light beam bundle from a first direction or a second light beam bundle from a second direction different to the first direction, having a microscope objective and a beam deflection element, wherein the beam deflection element is operable by a drive in order to optionally couple the first light beam bundle or the second light beam bundle into the microscope objective, and wherein the beam deflection element is rotatable by the drive in order to optionally change at least an exit direction of the first light beam bundle from the beam deflection element if the first light beam bundle is coupled into the microscope objective.