The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2009

Filed:

Jul. 27, 2005
Applicants:

Patrick Mills, Arlington, VA (US);

Paul Patterson, Newburgh, NY (US);

Jason Zara, Vienna, VA (US);

Stephen W. Smith, Durham, NC (US);

Inventors:

Patrick Mills, Arlington, VA (US);

Paul Patterson, Newburgh, NY (US);

Jason Zara, Vienna, VA (US);

Stephen W. Smith, Durham, NC (US);

Assignee:

The George Washington University, Washington, DC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An amplified bimorph scanning mirror for use in various optical systems, an optical coherence tomography scanner incorporating the amplified bimorph scanning mirror, and a method for manufacturing the foregoing are described. A method for optically scanning a target site using the amplified bimorph scanning mirror is further provided. The scan range which can be obtained by exemplary implementations of the present invention can be larger than the scan range made available by conventional scanners.


Find Patent Forward Citations

Loading…