The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2009

Filed:

Nov. 17, 2006
Applicants:

Tarja T. Shakespeare, Kuopio, FI;

John F. Shakespeare, Kuopio, FI;

Inventors:

Tarja T. Shakespeare, Kuopio, FI;

John F. Shakespeare, Kuopio, FI;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for color measurements or other spectral measurements of a material are provided. An illuminating device generates light for illuminating a sample of material. A detector detects light that has interacted with the sample and provides a measurement of the light that has interacted with the sample. A controller adjusts a duty cycle of the illuminating device to control the illumination of the sample. The measurement could be used by an analyzer to determine a spectral characteristic of the sample (such as a color of the sample). The determination of the spectral characteristic could be done without using any measurement of light that has not interacted with the sample. One or multiple light emitting diodes (LEDs) could be used to illuminate the sample, and the duty cycle of individual LEDs or groups of LEDs could be adjusted.


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