The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Oct. 31, 2007
Kai Wing LI, Chelmsford, MA (US);
Louis Stephen Palecki, Southborough, MA (US);
Antonio G. Rizzo, Nashua, NH (US);
Edward P. Bittner, Tyngsboro, MA (US);
Kai Wing Li, Chelmsford, MA (US);
Louis Stephen Palecki, Southborough, MA (US);
Antonio G. Rizzo, Nashua, NH (US);
Edward P. Bittner, Tyngsboro, MA (US);
Assurance Technology Corporation, Carlisle, MA (US);
Abstract
A magnetic screening system uses directional gradiometers with high resolution and accuracy to measure magnetic field signatures of target objects (e.g., gun, knife, cell phone, keys) in a volume of interest. The measured signatures can be compared to signatures of known objects stored in a local database. Various mathematical processes may be used to identify or classify target object signatures. The magnetic screening system can operate in multiple modes, such as a tracking mode, measurement mode, calibration mode, and self-test mode. Calibration may be performed in substantially continous manner to allow calibration parameters to be adjusted during system operation (e.g., tracking mode) to compensate for changes in conditions that may impact calibration parameters. Through use of unique processes and designs, the magnetic screening system can achieve a high rate of processing persons for target objects.