The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 2009

Filed:

Jul. 20, 2007
Applicant:

Cornelis Huiszoon, Houston, TX (US);

Inventor:

Cornelis Huiszoon, Houston, TX (US);

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 5/08 (2006.01); G01V 5/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A photoelectric factor (PEF) that is corrected for standoff effects is obtained from measurements made with a single detector. A first PEF is obtained using a first pair of soft and hard windows and a second PEF is obtained using a second pair of soft and hard windows. Additional correction to the PEF may be made using a formation density measured by the logging tool.


Find Patent Forward Citations

Huiszoon, Cornelis. (2009). Measurement of standoff corrected photoelectric factor (U.S. Patent No. 7573027). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7573027

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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