The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Mar. 24, 2005
Hiroshi Sawa, Nagoya, JP;
Masanori Nagai, Nagoya, JP;
Yoshinori Sugiura, Nagoya, JP;
Shigenori Hamaoka, Fukuoka, JP;
Kentaro Iwanaga, Anjo, JP;
Keiji Enpuku, Fukuoka, JP;
Kohji Yoshinaga, Kitakyushu, JP;
Hiroshi Sawa, Nagoya, JP;
Masanori Nagai, Nagoya, JP;
Yoshinori Sugiura, Nagoya, JP;
Shigenori Hamaoka, Fukuoka, JP;
Kentaro Iwanaga, Anjo, JP;
Keiji Enpuku, Fukuoka, JP;
Kohji Yoshinaga, Kitakyushu, JP;
Inoac Corporation, Aichi-ken, JP;
Abstract
A test cell for magnetic immunoreaction assay, comprising a polymer having a quantity of residual magnetism of 15 pT or less, when a magnetic field is applied under a magnetic field of 0.1 T, and with a distance between a sample and a SQUID sensor being set at 1.5 mm, and a method for producing the test cell are provided. A test cell for magnetic immunoreaction assay, comprising a polymer having a metal content of 30 ppb or less, and a method for producing the test cell are also provided. A magnetic signal detected from a magnetic marker to be measured is not buried in or lost to the residual magnetic signal of the test cell itself, but data discrimination can be made clearly.