The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2009
Filed:
Jul. 19, 2007
Apparatus, system, and method for determining a time-temperature history of an aftertreatment device
Thomas M. Yonushonis, Columbus, IN (US);
Randall J. Stafford, Columbus, IN (US);
Conrad J. Simon, Iii, Columbus, IN (US);
Bryan E. Blackwell, Brownsburg, IN (US);
Kevin Westerson, El Paso, TX (US);
Thomas M. Yonushonis, Columbus, IN (US);
Randall J. Stafford, Columbus, IN (US);
Conrad J. Simon, III, Columbus, IN (US);
Bryan E. Blackwell, Brownsburg, IN (US);
Kevin Westerson, El Paso, TX (US);
Cummins Filtration IP, Inc, Minneapolis, MN (US);
Abstract
An apparatus, system, and method are disclosed for determining a time-temperature history of an aftertreatment device. The apparatus includes an aftertreatment device comprising a substrate, and at least one thermal monitoring member (TMM) in thermal contact with the substrate. The TMMs may comprise a material that exhibits an electrical resistivity change at temperature over time. The apparatus may include a controller configured to measure the electrical resistivity of at least a portion of the TMMs, and to determine a thermal history based on the electrical resistivity measures.